Title :
A Weighting Multivariate Process Capability Index
Author_Institution :
Coll. of Software & Microelectron., Northwestern Polytech. Univ., Xi´an, China
Abstract :
Process quality ultimately decides on the quality of electronic products. Based on analyzing and improving process capability index (PCI), microelectronics process quality of electronic products may be effectively assured. Nowadays with the rapid development in microelectronics process, Quality evaluation of processes concerns more than one quality characteristics, microelectronics process quality evaluation concerns multi quality characteristics, therefore univariate PCI is difficultly used to synthetically analyze microelectronics process quality. The paper presents a multivariate PCI based on weight factor, which provides references for assuring and improving process quality while achieving overall evaluation of process quality and is not limited to the variable number. An example of calculating multivariate PCI (MPCI) is given. Real application shows that the method presented is effective and actual.
Keywords :
electronic products; integrated circuit manufacture; process capability analysis; quality control; statistical analysis; electronic product; microelectronic process quality; weight factor; weighting multivariate process capability index; Correlation; Covariance matrix; Fluctuations; Indexes; Microelectronics; Reliability engineering; Symmetric matrices; factor weight; multivariate; process capability index; quality characteristics;
Conference_Titel :
System Science, Engineering Design and Manufacturing Informatization (ICSEM), 2010 International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4244-8664-9
DOI :
10.1109/ICSEM.2010.11