X-ray detection of tiny defects in strongly scattered structures using the EMD method

Non-destructive testing of polymer materials meets specific problems caused by strongly scattering of X-ray detection. When the expected flaws are very small, the information reflected by the flaws may be hidden in the gray-level oscillation caused by strongly scattered structures of polymer materials. For improved detection of defects in polymer materials, a new automatic detection approach based on the EMD (Empirical Modal Decomposition) method, including a new algorithm that using IE (Information Entropy) and PSNR (Peak Signal to Noise Ratio) to control EMD optimal decomposition is proposed. The experimental investigations demonstrated a good performance of the proposed technique in the case of strongly scattering polymer sample. At the same time, it is suitable for all types of defect detection.