DocumentCode
53557
Title
Discrete-Event Shop-Floor Monitoring System in RFID-Enabled Manufacturing
Author
Jinwen Hu ; Lewis, Frank L. ; Oon Peen Gan ; Geok Hong Phua ; Leck Leng Aw
Author_Institution
Singapore Inst. of Manuf. Technol., Singapore, Singapore
Volume
61
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
7083
Lastpage
7091
Abstract
In this paper, a real-time discrete-event (DE)-based monitoring system is developed for radio-frequency identification (RFID)-enabled shop-floor monitoring in manufacturing industries. The monitoring system uses rigorous mathematical techniques for event construction, state prediction, and disturbance detection that are suitable for big-data environments of modern complex manufacturing systems. The biggest challenge is to design an efficient scheme for computers to process the event data fast and for engineers to modify the monitoring rules conveniently. First, a DE observer is designed to construct complex events from the simple events extracted from the raw RFID data. The DE observer is based on matrices with binary entries, and thus is easy for multiple users to interpret and modify to define new events or delete event definitions. Temporal relations between time-related events are also included. Second, a hidden Markov model, which considers the impact of user actions and disturbance events, is developed to predict the belief state of manufacturing systems and detect disturbances. Finally, an application case study of the developed system in the shop-floor monitoring of a precision machining parts manufacturing process is provided to show how it can help engineers/managers monitor the events and states efficiently.
Keywords
Big Data; computerised monitoring; discrete event systems; hidden Markov models; machining; manufacturing systems; radiofrequency identification; Big-Data; DE observer; RFID-enabled manufacturing systems; discrete-event shop-floor monitoring system; disturbance detection; hidden Markov model; mathematical techniques; precision machining parts; radio-frequency identification; real-time DE-based monitoring system; temporal relations; time-related events; Big data; Hidden Markov models; Manufacturing systems; Observers; Radiofrequency identification; Real-time systems; Big data; manufacturing; radio-frequency identification (RFID) monitoring;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/TIE.2014.2314068
Filename
6779618
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