Topography and structure of nanocomposite C-Ni field emitters

Author

Czerwosz, E. ; Iwanejko, I. ; Kaminska, A. ; Rymarczyk, J. ; Keczkowska, J. ; Suchanska, M. ; Craciunoiu, F. ; Comanescu, F.

Author_Institution

Tele&Radio Res. Inst., Warsaw, Poland

Volume

01

fYear

2010

fDate

11-13 Oct. 2010

Firstpage

91

Lastpage

94

Abstract

In this paper we present results of structural and topographical studies of C-Ni nanocomposite films with different Ni content. Films were obtained by PVD method. Their structure was investigated by Raman and FTIR spectroscopy and topography by AFM. Typical field emission current from these films is few μA (up to 10 μA) for 3kV anode-cathode voltage and 0.1mm anode-cathode distance.

Keywords

Fourier transform spectra; Raman spectra; atomic force microscopy; electron field emission; fullerenes; infrared spectra; nanocomposites; nickel; thin films; AFM; C-Ni; FTIR spectroscopy; PVD method; Raman spectroscopy; anode-cathode distance; anode-cathode voltage; field emitters; nanocomposite films; nanocomposite structure; topography; voltage 3 kV; Films; Laser beams; Measurement by laser beam; Nickel; Surface topography; AFM; FTIR; PVD; Raman; field emission; nanocomposite film;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Conference (CAS), 2010 International

Conference_Location

Sinaia

ISSN

1545-827X

Print_ISBN

978-1-4244-5783-0

Type

conf

DOI

10.1109/SMICND.2010.5650263

Filename

5650263