DocumentCode
53688
Title
Engineering Electrical Interfaces to Silicon via Indium Solder
Author
Panas, Robert M. ; Culpepper, Martin L.
Author_Institution
Dept. of Mech. Eng., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
62
Issue
6
fYear
2015
fDate
Jun-15
Firstpage
1977
Lastpage
1983
Abstract
This paper provides engineering models of a simple and robust approach for creating electrical connections to silicon using reduced temperature (<;200 °C substrate) soldering. This removes a significant hurdle to the fabrication of high performance, custom silicon piezoresistors. The approach focuses on reducing the resistance of diodes that are undergoing reverse bias behavior, commonly considered to be unacceptable for electrical connections. Reverse bias Schottky barrier analytical models based on quantum mechanical first principles are developed to explain how the behavior is affected by doping, soldering temperature, and geometry. This understanding is encapsulated within parametric models that enable rapid design and optimization of the electrical contacts to silicon. Using this model, one may design contacts for practical applications that do not require the conventional microfabrication processing or the high-temperature processing. Indium solder is found to be the best solder for this process, with ohmic contact resistances of ≈1 Ω-cm2 for (110) p-type wafers at 1017 cm-3 doping.
Keywords
Schottky barriers; electrical contacts; elemental semiconductors; indium alloys; microfabrication; piezoresistive devices; resistors; semiconductor device manufacture; semiconductor doping; silicon alloys; soldering; solders; In; Schottky barrier analytical models; Si; doping; electrical connections; engineering electrical interfaces; high-temperature processing; microfabrication; ohmic contact; parametric models; piezoresistors; silicon via indium solder; soldering temperature; Conductivity; Contacts; Doping; Indium; Resistance; Silicon; Soldering; Indium; Schottky diode; reverse bias; schottky diode; soldering; soldering.;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2421413
Filename
7101852
Link To Document