DocumentCode :
536985
Title :
A Study on the Control System in Multi-Parameters Intelligent Detection System of Deep Holes
Author :
Hao, Yunhai
Author_Institution :
Coll. of Comput. Sci., Changchun Univ. of Sci. & Technol., Changchun, China
fYear :
2010
fDate :
7-9 Nov. 2010
Firstpage :
1
Lastpage :
5
Abstract :
The article mainly concerns the study on the control system in the Multi-Parameters intelligent detection system of deep holes from such aspects as diameter, straightness degree, roughness, coating thickness. The Multi-Parameters intelligent detection system of deep holes is the combination and application of some advanced technology in measuring & detecting technology such as modern sensor technology, auto-control technology, information technology and computer technology. The system consists of sensors A/D circuit, signal processing system, single chip microcomputer control circuit and series port communication circuit. The main function of sensors is to make able the transfer of non-electric signal to electric signal. A/D deals with the transfer of analogue signal to digital signal. Signal processing system helps amplify the detecting signal. Single chip microcomputer control circuit is chiefly in charge of the action of moving device and sensors, cooperating control of the system, and the receiving, processing and saving of data. Series port communication circuit is responsible for the communication between the single chip microcomputer and computer, that is, to respond to the detecting demand from the computer first and then send the processed data to the computer.
Keywords :
analogue-digital conversion; control engineering computing; deep levels; hole traps; microprocessor chips; military computing; weapons; artillery chamber; auto-control technology; computer technology; control system; deep holes; information technology; modern sensor technology; multiparameters intelligent detection system; sensors A/D circuit; series port communication circuit; signal processing system; single chip microcomputer control circuit; Artificial intelligence; Classification algorithms; Gratings; Laser beams; Microcomputers; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
E-Product E-Service and E-Entertainment (ICEEE), 2010 International Conference on
Conference_Location :
Henan
Print_ISBN :
978-1-4244-7159-1
Type :
conf
DOI :
10.1109/ICEEE.2010.5660832
Filename :
5660832
Link To Document :
بازگشت