• DocumentCode
    538396
  • Title

    A synchronization profiler for hybrid full system simulation platform

  • Author

    Chen, Kuan-Chung ; Chen, Chung-Ho

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2010
  • fDate
    22-23 Nov. 2010
  • Firstpage
    91
  • Lastpage
    94
  • Abstract
    A hybrid abstraction of a full system simulation platform can provide flexible hardware-and-software co-verification and co-simulation in early stage of system-on-a-chip development. Being a hybrid abstraction for the simulated system, it has the advantage of faster simulation speed; however, its lack of timing information and no performance-metric synchronization mechanism among the different abstraction levels of the simulation models present troubles in doing performance analysis. To facilitate performance evaluations for hybrid abstraction simulation systems, in this paper, we propose a synchronization profiler to enable cross-abstraction level performance analysis and at the same time retain the fast simulation advantage. This approach allows a design engineer to evaluate not only the interactions between an application and its accelerated hardware but also the corresponding device drivers as well as the OS kernel.
  • Keywords
    abstracting; formal verification; hardware-software codesign; system-on-chip; accelerated hardware; cross-abstraction level performance analysis; device drivers; flexible hardware-and-software coverification; hybrid abstraction simulation systems; hybrid full system simulation platform; performance evaluation; performance metric synchronization; simulation model; synchronization profiler; system-on-a-chip development; timing information; Driver circuits; Engines; Graphics processing unit; Hardware; Registers; Synchronization; electronic system level design; hybrid full system simulation; simulation synchronization profiler;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference (ISOCC), 2010 International
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-8633-5
  • Type

    conf

  • DOI
    10.1109/SOCDC.2010.5682966
  • Filename
    5682966