Metrological Traceability in Waveguide S-parameter Measurements at 1.0 THz Band

Author

Horibe, Masahiro ; Kishikawa, Ryoko

Author_Institution

Nat. Inst. of Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan

Volume

62

Issue

6

fYear

2013

fDate

Jun-13

Firstpage

1814

Lastpage

1820

Abstract

We have improved the measurement uncertainty for rectangular waveguide vector network analyzer (VNA) measurements in the WM-250 (WR 1.0), 750 GHz-1.1 THz frequency band. We developed a new waveguide flange design for precise connections and dimensional measurements to establish traceability to SI in VNA measurements. This is the first such achievement to be reported using a VNA in the terahertz frequency band.

Keywords

S-parameters; electric variables measurement; flanges; measurement uncertainty; network analysers; rectangular waveguides; submillimetre wave measurement; terahertz waves; SI; VNA measurements; WM-250; dimensional measurements; frequency 750 GHz to 1.1 THz; measurement uncertainty; metrological traceability; precise connections; rectangular waveguide VNA measurement; rectangular waveguide vector network analyzer; terahertz frequency band measurement; waveguide S-parameter measurements; waveguide flange design; Apertures; Frequency measurement; Measurement uncertainty; Scattering parameters; Standards; Transmission line measurements; Uncertainty; Measurement uncertainty; rectangular waveguide; scattering parameter (S-parameter) measurement; terahertz; traceability; vector network analyzers (VNA);

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2013.2240953

Filename

6461124