Title :
Evaluation Method for Effective Resolution of Measurement System Based on Sub-pixel
Author :
Li´Na, Yang ; Wenhua, Cui
Author_Institution :
Jiaxing Univ. of Mech. & Electr. Eng., Jiaxing, China
Abstract :
In this paper, an evaluation method for effective resolution of measurement system is designed based on ANOVA and Correlation analysis. An evaluation platform based on this method is designed. Finally, constructs an machine vision detection system of ceramic substrates, evaluates sub-pixel method of advanced Sobel operator and three - order spline interpolation function, and calculates the actual accuracy of sub-pixel method applied to machine vision inspection system.
Keywords :
computer vision; correlation methods; image resolution; interpolation; object detection; splines (mathematics); statistical analysis; ANOVA; Sobel operator; correlation analysis; evaluation method; machine vision detection system; machine vision inspection system; measurement system effective resolution; spline interpolation function; subpixel method; Automation; Mechatronics; ANOVA; Correlation Analysis; Effective Rresolution; Machine Vision; Sub-pixel;
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2011 Third International Conference on
Conference_Location :
Shangshai
Print_ISBN :
978-1-4244-9010-3
DOI :
10.1109/ICMTMA.2011.307
