• DocumentCode
    54006
  • Title

    Effects of Mass Layer Stiffness and Imperfect Bonding on a Quartz Crystal Microbalance

  • Author

    Xiongjun Li ; Yu Wang ; Tan Xiao ; Qing Jiang ; Jiashi Yang

  • Author_Institution
    Dept. of Biomed. Eng., Sun Yat-Sen Univ., Guangzhou, China
  • Volume
    13
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    574
  • Lastpage
    580
  • Abstract
    We study free vibrations of a crystal plate of AT-cut quartz carrying a thin mass layer operating as a quartz crystal microbalance for mass sensing. The mass layer is imperfectly bonded to the crystal plate with its interface described by the so-called shear-slip model that allows a discontinuity of the interface displacement. The effect of mass layer in-plane shear stiffness is also considered. The equations of anisotropic elasticity are used for the crystal plate with the omission of the small elastic constant c56. The mass layer is governed by the plane-stress equations of elasticity. An analytical solution is obtained using Fourier series, from which the resonant frequencies and vibration mode shapes are calculated. The effects of the mass layer in-plane shear stiffness, imperfect interface bonding on resonant frequencies and energy trapping are examined.
  • Keywords
    Fourier analysis; acoustic devices; anisotropic media; elastic constants; elasticity; quartz crystal microbalances; vibrations; AT-cut quartz; Fourier series; anisotropic elasticity; crystal plate; elastic constant; energy trapping; imperfect bonding; interface displacement; mass layer in-plane shear stiffness effect; mass sensor; plane stress equation; quartz crystal microbalance; resonant frequency; shear-slip model; vibration mode shape; Charge carrier processes; Crystals; Equations; Mathematical model; Resonant frequency; Stress; Vibrations; Acoustic sensors; mass sensor; quartz crystal microbalance; resonator;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2012.2223755
  • Filename
    6328240