• DocumentCode
    540396
  • Title

    Method for characterizing dual-layer materials using a free space technique

  • Author

    Osman, N.H. ; Free, C.E.

  • Author_Institution
    Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    1781
  • Lastpage
    1784
  • Abstract
    In this paper, a new development of the method for characterizing dual layer dielectric materials using a free space technique is discussed. Mixing theory is applied to estimate the permittivity and loss tangent of the material, and a correction factor is added to improve the accuracy of the results. Measured data on the permittivity and loss tangent value of several materials between 145 GHz and 180 GHz are presented.
  • Keywords
    dielectric losses; dielectric materials; permittivity; correction factor; dual layer dielectric material; free space technique; loss tangent; mixing theory; permittivity estimation; Decision support systems; Material characterization; effective permittivity; free space measurement; mixing formula;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-7590-2
  • Electronic_ISBN
    978-1-902339-22-2
  • Type

    conf

  • Filename
    5728273
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=540396