DocumentCode
540691
Title
A systematic measurement technique to characterize bimodal oscillation for CMOS Quadrature LC-VCO
Author
Shin, Shih-Chieh ; Hsiao, Sen-Wen ; Poh, John Chung-Hang ; Laskar, Joy
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2010
fDate
7-10 Dec. 2010
Firstpage
1051
Lastpage
1054
Abstract
This paper presents a theoretical analysis and control procedure of the bimodal oscillation phenomenon inherent to LC-tuned Quadrature voltage-controlled oscillators (QVCOs). A systematic start-up procedure is proposed to drive the quadrature VCO (QVCO) into the desirable mode of operation by controlling its initial conditions. This is the first reported approach in the published literature to the best of author´s knowledge. The theory and the proposed methodology are validated with the measurement of a 13-GHz QVCO implemented in 90 nm CMOS using NMOS current-coupling topology.
Keywords
CMOS analogue integrated circuits; MMIC oscillators; circuit oscillations; field effect MMIC; voltage-controlled oscillators; CMOS quadrature LC-VCO; LC-tuned quadrature voltage-controlled oscillators; NMOS current-coupling topology; bimodal oscillation phenomenon; frequency 13 GHz; size 90 nm; systematic measurement technique; systematic start-up procedure; CMOS integrated circuits; MOS devices; Resonant frequency; Solid state circuits; Varactors; Voltage-controlled oscillators; 90-nm CMOS; Bimodal oscillation; phase ambiguity; quadrature phase generation; voltage-controlled oscillator (VCO);
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location
Yokohama
Print_ISBN
978-1-4244-7590-2
Electronic_ISBN
978-1-902339-22-2
Type
conf
Filename
5728574
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