• DocumentCode
    542301
  • Title

    Rescoring effectiveness of language models using different levels of knowledge and their integration

  • Author

    Wang, Wen ; Liu, Yang ; Harper, Mary P.

  • Author_Institution
    School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907-1285, USA
  • Volume
    1
  • fYear
    2002
  • fDate
    13-17 May 2002
  • Abstract
    In this paper, we compare the efficacy of a variety of language models (LMs) for rescoring word graphs and N-best lists generated by a large vocabulary continuous speech recognizer. These LMs differ based on the level of knowledge used (word, lexical features, syntax) and the type of integration of that knowledge (tight or loose). The trigram LM incorporates word level information; our Part-of-Speech (POS) LM uses word and lexical class information in a tightly coupled way; our new SuperARV LM tightly integrates word, a richer set of lexical features than POS, and syntactic dependency information; and the Parser LM integrates some limited word information, POS, and syntactic information. We also investigate LMs created using a linear interpolation of LM pairs. When comparing each LM on the task of rescoring word graphs or N-best lists for the Wall Street Journal (WSJ) 5k- and 20k- vocabulary test sets, the SuperARV LM always achieves the greatest reduction in word error rate (WER) and the greatest increase in sentence accuracy (SAC). On the 5k test sets, the SuperARV LM obtains more than a 10% relative reduction in WER compared to the trigram LM, and on the 20k test set more than 2%. Additionally, the SuperARV LM performs comparably to or better than the interpolated LMs. Hence, we conclude that the tight coupling of knowledge from all three levels is an effective method of constructing high quality LMs.
  • Keywords
    Computational modeling; Ear; Equations; Grammar; Hidden Markov models; Lattices; Mixers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing (ICASSP), 2002 IEEE International Conference on
  • Conference_Location
    Orlando, FL, USA
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-7402-9
  • Type

    conf

  • DOI
    10.1109/ICASSP.2002.5743835
  • Filename
    5743835