Title :
Technique of LFSR based test generator synthesis for deterministic and pseudorandom testing
Author :
Mosin, Sergey G. ; Chebykina, Natalia V. ; Serina, Maria S.
Author_Institution :
Comput. Eng. Dept., Vladimir State Univ. (VSU), Vladimir, Russia
Abstract :
The structure of test system based on application built-in self-test (BIST) circuitries has been proposed. The main idea is oriented on minimization of hardware overheads and dealt with automatization of BIST-circuitries generation. Test generator based on linear feedback shift register (LFSR) provides two types of testing - pseudorandom and deterministic. The proposed modified Berlekamp-Massey algorithm is used for generation the LFSR polynomial coefficients. The experimental results of technique application for some ISCAS´89 benchmark circuits have been shown.
Keywords :
automatic test pattern generation; built-in self test; integrated circuit testing; shift registers; Berlekamp-Massey algorithm; LFSR based test generator synthesis; built-in self-test; deterministic testing; linear feedback shift register; pseudorandom testing; Binary sequences; Built-in self-test; Design automation; Flip-flops; Generators; Polynomials; BIST; IC test; LFSR; MISR; polynom synthesis;
Conference_Titel :
CAD Systems in Microelectronics (CADSM), 2011 11th International Conference The Experience of Designing and Application of
Conference_Location :
Polyana-Svalyava
Print_ISBN :
978-1-4577-0042-2
