Title :
Valuing reliability of unrestorable systems
Author_Institution :
Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
Main reliability parameters for unrestorable symmetric systems ramified to level 3 and with ageing output elements are examined in this paper. Models for the failure probability, the failure frequency and the failure rate are worked out in the case when the lifetime of ageing output elements is circumscribed by the Weibull distribution.
Keywords :
Weibull distribution; reliability; Weibull distribution; reliability; symmetric systems; unrestorable systems; Availability; Exponential distribution; Hierarchical systems; Power system reliability; Reliability engineering; Weibull distribution; ageing elements; reliability parameters; symmetric systems; unrestorable systems;
Conference_Titel :
CAD Systems in Microelectronics (CADSM), 2011 11th International Conference The Experience of Designing and Application of
Conference_Location :
Polyana-Svalyava
Print_ISBN :
978-1-4577-0042-2
Electronic_ISBN :
978-966-2191-17-2
