DocumentCode :
544307
Title :
Femtosecond laser pulse diagnostics
Author :
Cain, Clarence P. ; Roach, W.P.
Author_Institution :
KRUG Life Sci., San Antonio, TX, USA
Volume :
1
fYear :
1992
fDate :
Oct. 29 1992-Nov. 1 1992
Firstpage :
322
Lastpage :
323
Abstract :
Special instrumentation is required to measure and analyze laser pulses below one nanosecond because of the limitations of standard instrumentation used to measure real-time signals. We have designed and developed an instrument with unique features to measure the pulsewidth of single laser pulses below one nanosecond using the standard autocorrelation technique. A single laser pulse is divided into two equal pulses by a 50/50 beamsplitter and recombined in space and in time inside a wafer of KDP crystal which generates a second harmonic of each fundamental pulse and a second harmonic of the combined pulses. These three pulses are then focused on a charge-coupled device (CCD) camera and analyzed by a laser beam analyzer to yield information on the FWHM (full-width-half-maximum) time of the original pulse. By using a CCD camera the full two-dimensional image can be recorded to insure that the correct horizontal profile is analyzed within the vertical profile. The delay for overlapping the beams in time is obtained by translating the beamsplitter while the positioning is obtained by rotating the beamsplitter. The design and results are discussed.
Keywords :
CCD image sensors; laser variables measurement; optical beam splitters; optical correlation; optical design techniques; optical focusing; optical harmonic generation; optical pulse generation; potassium compounds; 50/50 beamsplitter; CCD camera; FWHM; KDP; KDP crystal; charge-coupled device camera; femtosecond laser pulse diagnostics; full-width-half-maximum; laser beam analyzer; pulsewidth; second harmonic generation; standard autocorrelation; two-dimensional image; Pulse measurements; Rotation measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1992 14th Annual International Conference of the IEEE
Conference_Location :
Paris
Print_ISBN :
0-7803-0785-2
Electronic_ISBN :
0-7803-0816-6
Type :
conf
DOI :
10.1109/IEMBS.1992.5760985
Filename :
5760985
Link To Document :
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