DocumentCode
545456
Title
Entropy measure of XML schema document complexity metric
Author
Thaw, Tin Zar ; Khin, Mie Mie
Author_Institution
Univ. of Comput. Studies Mandalay, Mandalay, Myanmar
Volume
2
fYear
2011
fDate
11-13 March 2011
Firstpage
476
Lastpage
479
Abstract
Design of eXtensible Markup Language schema document (XSD) plays an extremely important role in software development process and needs to be quantified for ease of reusability and flexibility. In this paper, Entropy Measure of Complexity (EMC) metric is proposed. The EMC metric measures how element and attribute types of XSD are inheritance to one another. More EMC value leads to greater design complexity. On the other hand, greater complexity values imply that many types of elements and attributes in XSD may be reused and flexible. It is demonstrated with examples and validated theoretically and empirically through actual test cases.
Keywords
XML; computational complexity; entropy; software metrics; software reusability; XML schema document; entropy measure of complexity metric; software development process; software flexibility; software reusability; Complexity theory; Electromagnetic compatibility; Entropy; Programming; Software measurement; XML; Entropy Measure; Software development process; XSD; complexity values;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Research and Development (ICCRD), 2011 3rd International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-61284-839-6
Type
conf
DOI
10.1109/ICCRD.2011.5764178
Filename
5764178
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