• DocumentCode
    545456
  • Title

    Entropy measure of XML schema document complexity metric

  • Author

    Thaw, Tin Zar ; Khin, Mie Mie

  • Author_Institution
    Univ. of Comput. Studies Mandalay, Mandalay, Myanmar
  • Volume
    2
  • fYear
    2011
  • fDate
    11-13 March 2011
  • Firstpage
    476
  • Lastpage
    479
  • Abstract
    Design of eXtensible Markup Language schema document (XSD) plays an extremely important role in software development process and needs to be quantified for ease of reusability and flexibility. In this paper, Entropy Measure of Complexity (EMC) metric is proposed. The EMC metric measures how element and attribute types of XSD are inheritance to one another. More EMC value leads to greater design complexity. On the other hand, greater complexity values imply that many types of elements and attributes in XSD may be reused and flexible. It is demonstrated with examples and validated theoretically and empirically through actual test cases.
  • Keywords
    XML; computational complexity; entropy; software metrics; software reusability; XML schema document; entropy measure of complexity metric; software development process; software flexibility; software reusability; Complexity theory; Electromagnetic compatibility; Entropy; Programming; Software measurement; XML; Entropy Measure; Software development process; XSD; complexity values;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Research and Development (ICCRD), 2011 3rd International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-61284-839-6
  • Type

    conf

  • DOI
    10.1109/ICCRD.2011.5764178
  • Filename
    5764178