DocumentCode
547722
Title
Sequential circuits reliability analysis using conditional probabilities
Author
Jahanirad, Hadi ; Mohammadi, Karim ; Attarsharghi, Pejman
Author_Institution
Dept. of Electrical Engineering, Iran University of Science and Technology
fYear
2011
fDate
17-19 May 2011
Firstpage
1
Lastpage
4
Abstract
Reliability analysis using error probabilities for combinational logic circuits such as PTM has been investigated widely. Reliability analysis for sequential logic circuits using these methods would be inaccurate because of existence of loops in their architecture. In this paper a new method based on conversion of sequential circuit to combinational one and applying an iterative reliability analysis is developed. Experimental results demonstrate good accuracies of the method.
Keywords
Combinational circuits; Indexes; Integrated circuit reliability; Logic gates; Monte Carlo methods; Sequential circuits; PTM; conditional probability; error probability; reliability; sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Engineering (ICEE), 2011 19th Iranian Conference on
Conference_Location
Tehran, Iran
Print_ISBN
978-1-4577-0730-8
Electronic_ISBN
978-964-463-428-4
Type
conf
Filename
5955611
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