• DocumentCode
    54851
  • Title

    Stacking Signal TSV for Thermal Dissipation in Global Routing for 3-D IC

  • Author

    Po-Yang Hsu ; Hsien-Te Chen ; TingTing Hwang

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    33
  • Issue
    7
  • fYear
    2014
  • fDate
    Jul-14
  • Firstpage
    1031
  • Lastpage
    1042
  • Abstract
    With no further shrinking of device size, 3-D chip stacking by through-silicon-via (TSV) has been identified as an effective way to achieve better performance in speed and power. However, such solution inevitably encounters challenges in thermal dissipation since stacked dies generate a significant amount of heat per unit volume. We leverage an integrated design methodology of stacked-signal-TSVs to minimize temperature. Based on this structure, a three-stage TSV locating algorithm in global routing is designed. We demonstrate that our results, compared with baseline circuits, have 17% temperature reduction with 3% wiring overhead and no performance loss calculated by 3-D Elmore delay model. Compared with the paper by Cong and Zhang where additional thermal TSVs are inserted, our experimental results have in average 23% less TSVs with the same temperature constraint. Compared with the paper by Pathak and Lim, where movable signal TSVs are relocated to reduce temperature in hotspot regions, our result has 8% more temperature reduction with the same number of signal TSVs.
  • Keywords
    integrated circuit design; network routing; three-dimensional integrated circuits; 3D Elmore delay model; 3D IC; 3D chip stacking; TSV; baseline circuits; device size; global routing; hotspot regions; integrated design methodology; stacking signal TSV; temperature constraint; temperature reduction; thermal dissipation; three-stage TSV locating algorithm; through-silicon-via; Heat sinks; Heating; Routing; Stacking; Steiner trees; Thermal resistance; Through-silicon vias; 3-D IC; Global routing; stacked signal TSV; thermal dissipation; through-silicon-via (TSV);
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2014.2307488
  • Filename
    6835295