• DocumentCode
    549863
  • Title

    A 640×480 image sensor with unified pixel architecture for 2D/3D imaging in 0.11µm CMOS

  • Author

    Kim, Seong-Jin ; Kim, James D K ; Han, Sang-Wook ; Kang, Byongmin ; Lee, Keechang ; Kim, Chang-Yeong

  • Author_Institution
    Samsung Adv. Inst. of Technol., South Korea
  • fYear
    2011
  • fDate
    15-17 June 2011
  • Firstpage
    92
  • Lastpage
    93
  • Abstract
    A 3D image sensor is presented employing a time multiplexed concept for color and depth image acquisition in a single chip to generate a real-time 3D image of an arbitrary scene. The pixel adopts a split photodiode to demodulate time-of-flight signals effectively. Every four pixels share two storages and readout transistors to utilize 100% of photons and increase the sensitivity of infrared light by simple binning operation at the expense of resolution. With the fabricated prototype sensor, 640×480 color and depth images of the scenes 1-3m away are captured with an accuracy of 1-6cm.
  • Keywords
    CMOS image sensors; demodulation; image colour analysis; 2D/3D imaging; 3D image sensor; CMOS technology; color image acquisition; depth image acquisition; readout transistors; size 0.11 mum; split photodiode; time multiplexed concept; time-of-flight signal demodulation; unified pixel architecture; Accuracy; Color; Image color analysis; Imaging; Logic gates; Three dimensional displays; Time frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits (VLSIC), 2011 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    2158-5601
  • Print_ISBN
    978-1-61284-175-5
  • Type

    conf

  • Filename
    5986400