Reliability analysis of a reparable multistate device attended by a repairman with single vacation

Author

Ma Lixia ; Xu Genqi

Author_Institution

Dept. of Math., Tianjin Univ., Tianjin, China

fYear

2011

fDate

22-24 July 2011

Firstpage

1178

Lastpage

1183

Abstract

A reparable multistate device attended by a repairman with single vacations is discussed in this paper. It is assumed that the life of the operating unit and the vacation time of the repairman were both exponential distributions, while the repair time of the unit has a general continuous distribution. By using the C₀-semigroup theory and analyzing the spectra distribution of the system operator, the unique existence of the solution, the non-negative steady-state solution and the exponential stability of the system are derived. Based on this, some reliability indices of the system are presented at the end of the paper.

Keywords

asymptotic stability; exponential distribution; group theory; reliability theory; C₀ semigroup theory; continuous distribution; exponential distribution; exponential stability; reliability analysis; repairman-with-single vacation; reparable multistate device; Asymptotic stability; Eigenvalues and eigenfunctions; Equations; Maintenance engineering; Stability analysis; Steady-state; Asymptotic Stability; Availability; C0 Semigroup; Exponential Stability; Linear operator; Steady-state Reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Control Conference (CCC), 2011 30th Chinese

Conference_Location

Yantai

ISSN

1934-1768

Print_ISBN

978-1-4577-0677-6

Electronic_ISBN

1934-1768

Type

conf

Filename

6001067