• DocumentCode
    55183
  • Title

    Fault Attacks on STRNGs: Impact of Glitches, Temperature, and Underpowering on Randomness

  • Author

    Martin, Harold ; Korak, Thomas ; San Millan, Enrique ; Hutter, Marcus

  • Author_Institution
    Univ. Carlos III de Madrid, Leganes, Spain
  • Volume
    10
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    266
  • Lastpage
    277
  • Abstract
    True random number generators (TRNGs) are the basic building blocks of cryptographic implementations. They are used to generate random numbers required for security protocols, to generate ephemeral keys, and are often used in hiding or masking countermeasures to thwart implementation attacks. The protection of TRNGs is an important issue to guarantee the security of cryptographic systems but less attention has been made in the past to evaluate the susceptibility of these building blocks against passive and active attacks. In this paper, we present active fault attacks on a recently proposed specific TRNG architecture presented by Cherkaoui et al. at CHES 2013. We successfully injected power and clock glitches in an FPGA implementation and elaborated the design in respect of thermo and underpowering attacks. Furthermore, we propose a method on how to reduce the susceptibility of these attacks to increase the resistance against fault attacks. To the best of our knowledge, this is the first work that evaluates practical clock-glitch-based fault attacks on self-timed ring-based TRNGs.
  • Keywords
    cryptographic protocols; field programmable gate arrays; random number generation; CHES 2013; FPGA implementation; STRNG; TRNG architecture; active attack; active fault attack; clock glitch; cryptographic implementation; cryptographic system; ephemeral key; glitches; implementation attack; passive attack; power glitch; practical clock-glitch-based fault attacks; randomness; security protocol; self-timed ring-based TRNG; temperature; true random number generators; Circuit faults; Clocks; Cryptography; Delays; Field programmable gate arrays; Jitter; Temperature measurement; Clock Glitches; FPGAs; Fault Attacks; TRNG; Temperature; clock glitches; fault attacks; temperature;
  • fLanguage
    English
  • Journal_Title
    Information Forensics and Security, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1556-6013
  • Type

    jour

  • DOI
    10.1109/TIFS.2014.2374072
  • Filename
    6965651