DocumentCode :
551846
Title :
Experimental apparatus for simultaneous measurement of temperature and emissivity at medium-high temperature
Author :
Yufang Liu ; Kun Yu ; Shi, Deheng
Author_Institution :
Sch. of Optoelectron., Beijing Inst. of Technol., Beijing, China
Volume :
3
fYear :
2011
fDate :
29-31 July 2011
Abstract :
Based on the Kirchhoff´s law, an experimental apparatus was configured and fabricated to facilitate accurate emissivity and temperature measurements at medium-high temperature. The apparatus consists of four parts: the sample heating system, optical receiving system, signal amplifying and controlling system, and display system. In order to validate the experimental device, the temperature and emissivity of SUS 201 is measured between 823K and 1373K at 1.5μm. The estimated uncertainty of temperature measurement is better than 0.3%. An instrument for practical temperature measurement can be developed according to the measuring principle.
Keywords :
emissivity; instruments; measurement uncertainty; temperature measurement; Kirchhoff law; controlling system; display system; emissivity measurement; experimental apparatus; measurement uncertainty; medium-high temperature; optical receiving system; sample heating system; signal amplifying; size 1.5 mum; temperature 823 K to 1373 K; temperature measurement; Calibration; Detectors; Heating; Instruments; Temperature; Temperature measurement; calibration; emissivity; instrument; optical measurement; temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Optoelectronics (ICEOE), 2011 International Conference on
Conference_Location :
Dalian, Liaoning
Print_ISBN :
978-1-61284-275-2
Type :
conf
DOI :
10.1109/ICEOE.2011.6013317
Filename :
6013317
Link To Document :
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