Title :
Lifetime investigation of high power IGBT modules
Author :
Due, J. ; Munk-Nielsen, Stig ; Nielsen, Rodney
Author_Institution :
Dept. of Energy Technol., Aalborg Univ., Aalborg, Denmark
fDate :
Aug. 30 2011-Sept. 1 2011
Abstract :
This article concerns lifetime investigation of high power IGBT modules. Other research investigating wind turbine failures of modern wind turbines observed that the power converter counts for 15% of all failures. A test bench capable of testing the IGBT power modules in an accelerated application specific working point was constructed. The working point was given with regards to voltage, current, power and phase. An analysis of failure mechanisms in modern IGBT modules was conducted. From this it was concluded that VCE of the IGBTs can be used as an indication of wear out of an IGBT module. Through circuit analysis and other studies it was concluded that a change of around 30 mV was to be expected. A innovative measuring system capable of measuring VCE of the IGBTs and VD of the diodes with high accuracy was implemented. Three test periods was conducted, and each period lasted 7-14 days. Every 5 minutes all VCE and VD voltage drop were measured and saved. From the measurements it was concluded that the wear out of IGBT modules can be traced through VCE and VD.
Keywords :
electric potential; insulated gate bipolar transistors; power convertors; wind turbines; application specific working point; circuit analysis; high power IGBT modules; innovative measuring system; lifetime investigation; power converter; voltage drop; wind turbine failures; Current measurement; Insulated gate bipolar transistors; Multichip modules; Relays; Temperature measurement; Voltage measurement; Wind turbines; 3D-CT scan; Coffin-manson; IGBT lifetime; IGBT power cycling; VCE measurement;
Conference_Titel :
Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-61284-167-0
Electronic_ISBN :
978-90-75815-15-3