• DocumentCode
    555386
  • Title

    Multifractal aspects of software development: NIER track

  • Author

    Hindle, Abram ; Godfrey, Michael W. ; Holt, Richard C.

  • Author_Institution
    Dept. of Comput. Sci., Univ. of California, Davis, Davis, CA, USA
  • fYear
    2011
  • fDate
    21-28 May 2011
  • Firstpage
    968
  • Lastpage
    971
  • Abstract
    Software development is difficult to model, particularly the noisy, non-stationary signals of changes per time unit, extracted from version control systems (VCSs). Currently researchers are utilizing timeseries analysis tools such as ARIMA to model these signals extracted from a project´s VCS. Unfortunately current approaches are not very amenable to the underlying power-law distributions of this kind of signal. We propose modeling changes per time unit using multifractal analysis. This analysis can be used when a signal exhibits multi-scale self-similarity, as in the case of complex data drawn from power-law distributions. Specifically we utilize multifractal analysis to demonstrate that software development is multifractal, that is the signal is a fractal composed of multiple fractal dimensions along a range of Hurst exponents. Thus we show that software development has multi-scale self-similarity, that software development is multifractal. We also pose questions that we hope multifractal analysis can answer.
  • Keywords
    fractals; software engineering; time series; ARIMA; Hurst exponents; NIER track; VCS; multifractal analysis; multifractal aspects; multiple fractal dimensions; multiscale self-similarity; nonstationary signals; software development; timeseries analysis tools; underlying power-law distributions; version control systems; Fractals; Heart; Programming; Software; Software engineering; Wavelet analysis; Wavelet transforms; fractal; multifractal; power-law; version control; wavelets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering (ICSE), 2011 33rd International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4503-0445-0
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1145/1985793.1985962
  • Filename
    6032564