Reliability function of electronic equipments suffering a single environmental stress based on Poisson Process

Environmental stresses are usually crucial factors leading to the fault of Electronic Equipments. In the past, Stress-Strength Interference Model (SSI) was applied extensively to analyze the reliability of Electronic Equipments suffering environmental stresses, correspondingly, the reliability was acquired as a fixed value. However, the reliability decreases as time goes on. For that reason, this paper establishes the function of the reliability of Electronic Equipments and time based on Poisson Process, improving Stress-strength Interference Model of Reliability. First, some relevant theories of Poisson Process and characteristics of environmental stresses are presented. Secondly, this paper studies the statistical property of a single environmental stress over time, and then, established the function of reliability and time. This function is verified by Monte-Carlo Simulation. At last, an example is provided to illustrate the feasibility of the findings in practice. This paper presents a new method to study the reliability of Electronic Equipments suffering a single environmental stress. In addition, the findings can be expected to provide guidelines for reliability design and life forecasting of Electronic Equipments.