The application of line-labeling algorithm to on-line defect detection system for printed-matter

Author

Xu, Min ; Tang, Wanyou

Author_Institution

Sch. of Packing & Printing Eng., TianJin Univ. of Sci. & Technol., Tianjin, China

Volume

1

fYear

2011

fDate

15-17 Oct. 2011

Firstpage

310

Lastpage

313

Abstract

The Application of Line-labeling algorithm to on-line defect detection system for printed-matter was studied in this paper and it was compared with Pixel Labeled Algorithm. The algorithm is based on the line between rows. Connected regions of defect were marked and their parameters (position, area, etc) were obtained rapidly by scan the full image only once, while the full image has to be scanned twice and an equivalent mark table has to be produced in Pixel Labeled Algorithm. Practical application shows that Line-labeling algorithm is more suitable for on-line defect detection system.

Keywords

image processing; object detection; full image; line-labeling algorithm; online defect detection system; pixel labeled algorithm; printed-matter; Arrays; Educational institutions; Image color analysis; Image segmentation; Labeling; Shape; Signal processing algorithms; Line-labeling algorithm; Pixel Labeled Algorithm; on-line defect detection system;

fLanguage

English

Publisher

ieee

Conference_Titel

Image and Signal Processing (CISP), 2011 4th International Congress on

Conference_Location

Shanghai

Print_ISBN

978-1-4244-9304-3

Type

conf

DOI

10.1109/CISP.2011.6100020

Filename

6100020