Analysis of opto-microwave paths into a InP/InGaAs UTC-HPT

Author

Schiellein, Julien ; Rosales, Marc ; Polleux, Jean-Luc ; Algani, Catherine ; Merlet, Thomas ; Riet, Muriel ; Godin, Jean ; Scavennec, Andre

fYear

2011

fDate

10-13 Oct. 2011

Firstpage

949

Lastpage

952

Abstract

This paper presents the spatially dependent analysis of the frequency behavior of an InP/InGasAs UTC-HPT. It outlines the steps needed to perform phototransistor characterization. It starts with the design of an automated test measurement setup and the implementing of different post-processing routines for measurements de-embedding. These de-embedding techniques are then evaluated for their relative accuracy. Finally, the extracted phototransistor mapping is analyzed to evaluate the lateral spatial dependencies of the UTC-HPT´s responsivity. In particular, the 1A/W 52μm wide UTC-HPT under analysis exhibits an improvement in performance in the 3μm vicinity of electrical contacts.

Keywords

III-V semiconductors; automatic test pattern generation; gallium arsenide; indium compounds; microwave photonics; phototransistors; InP-InGaAs; UTC-HPT; automated test measurement setup; frequency behavior; measurements de-embedding; opto-microwave paths; phototransistor characterization; phototransistor mapping; spatially dependent analysis; Fingers; Indium phosphide; Microwave amplifiers; Microwave integrated circuits; Phototransistors; Probes; HPT; InP/InGaAs; UTC-HPT; Uni Travelling Carrier; phototransistor;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference (EuMC), 2011 41st European

Conference_Location

Manchester

Print_ISBN

978-1-61284-235-6

Type

conf

Filename

6101757