• DocumentCode
    558372
  • Title

    Wide band gap self-switching nanodevices for THz applications at room temperature

  • Author

    Gaquiere, C. ; Ducournau, G. ; Sangaré, P. ; Grimbert, B. ; Faucher, M. ; Iñiguez-de-la-Torre, I. ; Iñiguez-de-la-Torre, A. ; González, T. ; Mateos, J.

  • Author_Institution
    Inst. d´´Electron. de Microelectron. et de Nanotechnol., Villeneuve-d´´Ascq, France
  • fYear
    2011
  • fDate
    10-13 Oct. 2011
  • Firstpage
    1150
  • Lastpage
    1152
  • Abstract
    A self-switching diode (SSD) is based on an asymmetric nanochannel. The SSD is fabricated by tailoring the boundary of a narrow semiconductor channel to break its symmetry. An applied voltage V not only changes the potential profile along the channel direction but also either widens or narrows the effective channel width, depending on its sign. This results in a strong nonlinear current-voltage I-V characteristic, resembling that of a conventional diode which could be used for detection. Besides, the special geometry of SSDs benefits the onset of Gunn oscillations since the electrical field is well focused at the cathode side of the channel and the electron concentration is increased by the side field effect, so that the classical criteria for Gunn oscillations are more easily reached. The main advantage of using GaN is that it will provide much higher power than traditional GaAs Gunn diodes at very high frequency (in excess of 300 GHz) due to its high saturation velocity, high breakdown field and the possibility of high temperature operation. Here, detection measurements will be presented.
  • Keywords
    Gunn oscillators; microwave diodes; terahertz wave devices; Gunn oscillations; THz applications; asymmetric nanochannel; electron concentration; high breakdown field; high saturation velocity; narrow semiconductor channel; room temperature; self-switching diode; wide band gap self-switching nanodevices; Adaptation models; Gallium nitride; Nanoscale devices; Oscillators; Semiconductor device measurement; Semiconductor diodes; Semiconductor process modeling; AlGaN/GaN; Nano technology; Self-Switching Diode; THz measurements; Wide band gap devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2011 41st European
  • Conference_Location
    Manchester
  • Print_ISBN
    978-1-61284-235-6
  • Type

    conf

  • Filename
    6102016