DocumentCode :
55848
Title :
High-Quality Vertically Aligned Carbon Nanotubes for Applications as Thermal Interface Materials
Author :
Yagang Yao ; Ju Nie Tey ; Zhuo Li ; Jun Wei ; Bennett, K. ; McNamara, Andrew ; Joshi, Yash ; Tan, Rachel Lee Siew ; Ling, Sharon Nai Mui ; Ching-Ping Wong
Author_Institution :
Suzhou Inst. of Nanotech & Nanobionics, Suzhou, China
Volume :
4
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
232
Lastpage :
239
Abstract :
Vertically aligned carbon nanotube (VACNT) array is an ideal form for heat dissipation in electronic packaging, due to its high-intrinsic thermal conductivity and robust mechanical properties. In this paper, we report the growth of high-quality VACNTs for the applications as thermal interface materials (TIMs). The high-quality VACNTs were grown and confirmed by the characterizations of Raman and thermogravimetric analyses. Metalized VACNT array was transferred and bonded to a metalized silicon or copper substrate. The VACNT-based TIM structure (Si-Ti/Ni/Au-In-Ti/Ni/Au-VACNT-Ti/Ni/Au-In-Ti/Ni/Au-Cu) was then successfully made after bonding to another substrate (copper or silicon). The total boundary resistance between the VACNT array and the surrounding materials was measured by an infrared thermal imaging method. Compared with the TIM sample made from carbon nanotubes grown in our laboratory chemical vapor deposition (CVD), the thermal boundary resistance of the TIM sample made from CNTs in the black magic CVD was greatly reduced from 11.6±0.5 to 3.4±0.1 mm2 KW-1. Overall, these high quality, and bonded VACNT arrays demonstrate properties promising for next-generation TIM applications.
Keywords :
carbon nanotubes; chemical vapour deposition; cooling; copper; electronics packaging; elemental semiconductors; gold; indium; infrared imaging; nickel; semiconductor growth; silicon; thermal analysis; thermal conductivity; thermal resistance; thermal stability; titanium; SiTi-Ni-AuInTi-AuTi-Ni-AuInTi-Ni-AuCu; chemical vapor deposition; electronic packaging; heat dissipation; high intrinsic thermal conductivity; high quality vertically aligned carbon nanotubes; infrared thermal imaging method; metalized copper substrate; metalized silicon substrate; robust mechanical properties; thermal boundary resistance; thermal interface materials; thermogravimetric analyses; total boundary resistance; Arrays; Electronic packaging thermal management; Indium; Nickel; Silicon; Substrates; High quality; low-thermal resistance; thermal interface materials (TIMs); vertically aligned carbon nanotubes (VACNTs);
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2013.2296370
Filename :
6709667
Link To Document :
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