Development of automatic measurement system for fault detection for Ghz-band radio frequency devices

Author

Lee, Jung-Hoon ; Kim, Sung-Woo ; Park, Seung-Hun ; Ryu, Jee-Youl ; Bae, Jong-Il

Author_Institution

Dept. of Inf. & Commun. Eng., Pukyong Nat. Univ., Busan, South Korea

fYear

2011

fDate

26-29 Oct. 2011

Firstpage

621

Lastpage

624

Abstract

This paper proposes automatic fault measurement system for GH-band radio frequency (RF) devices. The system contains RF chip integrated with 0.18-μm BiCMOS SiGe process, control board, and PC with installed control program. The control board consists of RF Built-In Self-Test (BIST) circuit and digital signal processor (DSP). To verify performance of the measurement system we built a 1.8-GHz low noise amplifier (LNA). Proposed system helps it to provide DC output voltages, hence, making the RF system chain automatic.

Keywords

BiCMOS integrated circuits; Ge-Si alloys; UHF amplifiers; UHF integrated circuits; built-in self test; digital signal processing chips; fault diagnosis; frequency measurement; low noise amplifiers; BiCMOS process; DC output voltage; DSP; GHz-Band RF device; Ghz-band radiofrequency device; LNA; RF BIST circuit; RF built-in self-test circuit; RF chip integration; SiGe; automatic fault measurement system; control board; digital signal processor; fault detection; frequency 1.8 GHz; low noise amplifier; size 0.18 mum; Built-in self-test; Circuit faults; Detectors; Radio frequency; Semiconductor device measurement; Voltage measurement; Built-In Self-Test (BIST); GHz-band; fault measurement system;

fLanguage

English

Publisher

ieee

Conference_Titel

Control, Automation and Systems (ICCAS), 2011 11th International Conference on

Conference_Location

Gyeonggi-do

ISSN

2093-7121

Print_ISBN

978-1-4577-0835-0

Type

conf

Filename

6106078