• DocumentCode
    559784
  • Title

    Surface plasmon absorption topograph in a multi-layer Ti/Ag thin film by an optical beam scanning

  • Author

    Saiga, Noriaki ; Okamoto, Yoshihiro ; Matsumoto, Haruka

  • Author_Institution
    Dept. of Electron. Control Eng., Yonago Nat. Coll. of Technol., Yonago, Japan
  • fYear
    2011
  • fDate
    Oct. 30 2011-Nov. 2 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Surface plasmon polariton absorption was visualized over a large area of Ti/Ag thin film to observe the distribution of electron density. A converging light was incident on the surface at the angle of maximum absorption or some angles a little apart from it. The reflectance of the light showed up such an image as only the electron density distribution was in high contrast or the thickness variation of the film was enhanced. The calculation gave the qualitative verification of such imaging characteristics.
  • Keywords
    electron density; light reflection; metallic thin films; multilayers; polaritons; silver; surface plasmons; titanium; Ti-Ag; electron density distribution; film thickness variation; light reflectance; multilayer thin film; optical beam scanning; surface plasmon polariton absorption topograph; Argon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microopics Conference (MOC), 2011 17th
  • Conference_Location
    Sendai
  • Print_ISBN
    978-1-4577-1344-6
  • Type

    conf

  • Filename
    6110338