• DocumentCode
    55982
  • Title

    Extended Self-Dual Attribute Profiles for the Classification of Hyperspectral Images

  • Author

    Cavallaro, Gabriele ; Dalla Mura, Mauro ; Benediktsson, Jon Atli ; Bruzzone, Lorenzo

  • Author_Institution
    Fac. of Electr. & Comput. Eng., Univ. of Iceland, Reykjavik, Iceland
  • Volume
    12
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    1690
  • Lastpage
    1694
  • Abstract
    In this letter, we explore the use of self-dual attribute profiles (SDAPs) for the classification of hyperspectral images. The hyperspectral data are reduced into a set of components by nonparametric weighted feature extraction (NWFE), and a morphological processing is then performed by the SDAPs separately on each of the extracted components. Since the spatial information extracted by SDAPs results in a high number of features, the NWFE is applied a second time in order to extract a fixed number of features, which are finally classified. The experiments are carried out on two hyperspectral images, and the support vector machines and random forest are used as classifiers. The effectiveness of SDAPs is assessed by comparing its results against those obtained by an approach based on extended APs.
  • Keywords
    geophysical image processing; hyperspectral imaging; image classification; mathematical morphology; nonparametric statistics; random processes; support vector machines; NWFE; SDAP; SVM classifier; extended self-dual attribute profile; hyperspectral image classification; morphological processing; nonparametric weighted feature extraction; random forest; spatial information extraction; support vector machine; Accuracy; Data mining; Feature extraction; Hyperspectral imaging; Support vector machines; Attribute filters (AFs); attribute profiles (APs); extended APs (EAPs); mathematical morphology; nonparametric weighted feature extraction (NWFE); remote sensing; self-dual APs (SDAPs);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2015.2419629
  • Filename
    7103273