Noise and Correlation Study of Quantum Hall Devices

Author

Schurr, Jurgen ; Ahlers, F. ; Callegaro, Luca

Author_Institution

Phys.-Tech. Bundesanstalt, Braunschweig, Germany

Volume

62

Issue

6

fYear

2013

fDate

Jun-13

Firstpage

1574

Lastpage

1580

Abstract

We report voltage noise measurements on the cryogenic quantum Hall resistance (QHR) and present two new findings to illustrate the potential of the two-channel instrumentation used. Without applied current, only Johnson-Nyquist noise is present, but at two separate pairs of quantum Hall terminals, it can be cross-correlated via a longitudinal resistance. With applied current, excess noise due to dissipation bursts appears, which increases dramatically with the noninteger fraction of the filling factor.

Keywords

Hall effect devices; burst noise; correlation theory; cryogenics; electric noise measurement; quantum Hall effect; thermal noise; voltage measurement; Johnson-Nyquist noise; burst noise; channel instrumentation; correlation; cryogenic QHR; filling factor; longitudinal resistance; quantum Hall device; quantum Hall terminal; voltage noise measurement; Electrical resistance measurement; MODFETs; Noise; Noise measurement; Resistance; Temperature measurement; Voltage measurement; Burst noise; Fourier transforms; correlation; data acquisition; noise measurement; quantum Hall effect; white noise;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2012.2230733

Filename

6403912