EMC immunity of an integrated low side driver circuit under varying RF loads

Author

Nzalli, Hermann ; Lautensack, Christian ; Wilkening, Wolfgang ; Jansen, Rolf H.

Author_Institution

Robert Bosch GmbH (AE/EIM), Reutlingen, Germany

fYear

2011

fDate

6-9 Nov. 2011

Firstpage

1

Lastpage

6

Abstract

We present EMC immunity investigations for an integrated low side driver circuit in Smart Power technology. The output (drain) voltage is monitored while it is subjected to direct power injection (DPI). DPI immunity is characterized for different load conditions. The results show that robustness significantly differs for different types of RF loads and provide a quantification. Control of the load dependence of immunity is relevant especially for IC-Pins which are connected directly to external circuitry or wiring.

Keywords

driver circuits; electromagnetic compatibility; radiofrequency integrated circuits; DPI; EMC immunity; IC-pin; RF load; Smart Power technology; direct power injection; integrated low side driver circuit; load dependence immunity; output drain voltage monitoring; Frequency measurement; Immunity testing; Impedance; Logic gates; Radio frequency; Transistors; EMC (Electromagnetic compatibility); RF immunity; direct power injection (DPI); low side driver; variable load;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on

Conference_Location

Dubrovnik

Print_ISBN

978-1-4577-0862-6

Type

conf

Filename

6130041