• DocumentCode
    560469
  • Title

    Modeling and analysis of power supply noise effects on analog-to-digital converter in 3DIC

  • Author

    Bae, Bumhee ; Shim, Yujeong ; Cho, Jonghyun ; Kim, Joungho

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2011
  • fDate
    6-9 Nov. 2011
  • Firstpage
    198
  • Lastpage
    202
  • Abstract
    In this paper, the modeling and analysis of power supply noise effects on analog-to-digital converter (ADC) with chip-Package-PCB hierarchical power distribution network (PDN) is proposed. Especially, this research is focused on the PDN structure, which includes power/ground Through-Silicon-Via (TSV) for the case study of various PDN structures. The analysis was progressed with a frequency range from 1MHz to 3GHz. Analysis results indicate that ADC performance is degraded by power supply noise and it depends on PDN structures. The performance of ADC which interconnected by TSV was worse than that of ADC which interconnected by wirebond, because TSV has lower inductance than wire-bond.
  • Keywords
    analogue-digital conversion; chip-on-board packaging; distribution networks; integrated circuit interconnections; lead bonding; power supply circuits; printed circuits; three-dimensional integrated circuits; 3DIC; PDN structure; TSV interconnection; analog-to-digital converter; chip-package-PCB; frequency 1 MHz to 3 GHz; hierarchical power distribution network; power supply noise effects; through-silicon-via; wire bond; Couplings; Integrated circuit modeling; Mathematical model; Noise; Power supplies; System-on-a-chip; Through-silicon vias; ADC; PDN; Power Supply Noise; SSN; TSV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
  • Conference_Location
    Dubrovnik
  • Print_ISBN
    978-1-4577-0862-6
  • Type

    conf

  • Filename
    6130063