Investigation on the susceptibility of two-stage voltage comparators to EMI

Author

Fiori, Franco

Author_Institution

Eln. Dept., Politec. di Torino, Turin, Italy

fYear

2011

fDate

6-9 Nov. 2011

Firstpage

241

Lastpage

244

Abstract

This paper deals with the susceptibility of a common CMOS voltage comparators to radio frequency interference. Specifically, the circuit topology that comprise a differential stage cascaded with a common source gain stage is considered. The detrimental effect of the RFI superimposed onto the nominal input signals is investigated through time domain computer simulations and through experiments carried out on a test chip.

Keywords

CMOS integrated circuits; comparators (circuits); network topology; radiofrequency interference; EMI; RFI; circuit topology; common CMOS voltage comparators; common source gain stage; nominal input signals; radiofrequency interference; time domain computer simulation; two-stage voltage comparators; CMOS integrated circuits; Electromagnetic compatibility; Radio frequency; Threshold voltage; Time domain analysis; Transistors; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on

Conference_Location

Dubrovnik

Print_ISBN

978-1-4577-0862-6

Type

conf

Filename

6130071

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=560477