Impact of GND-PTH stitches in DDR3/GDDR3/GDDR5 Memory controller packages

Author

Ahmad, Hany ; Badesha, Amolak

Author_Institution

Agilent Technol. Inc., Santa Clara, CA, USA

fYear

2011

fDate

6-9 Nov. 2011

Firstpage

99

Lastpage

104

Abstract

DDR3 and GDDR3/5 memory technology running in the Giga-bit range require 3D EM accurate modeling of RF phenomena such as the impact of G ND-PTH stitches (G round Plated Through Hole) used to connect reference ground-planes in the Memory controller packages (MCH-PKG). Cost-reduction requires minimizing the number of layers and vias on MCH-PKG (micro-vias and PTH). Layout-Designers usually revert to reduce the GND-PTH without studying the impact on the performance. In this paper, Method of Moments (MoM) is used to study the impact of GND-PTH on data eye-opening as well as on Radiated-Emission of a DDR3 two-SODIMMs/channel running at 1.33GB/s.

Keywords

DRAM chips; controllers; low-power electronics; method of moments; GDDR3; GDDR5; GND-PTH stitches; memory controller packages; method of moments; Conferences; Electromagnetic compatibility; Memory management; Moment methods; Scattering parameters; Solid modeling; Three dimensional displays; Antenna-Gain; Convolution time-domain ADS engine; DDR3; GDDR3/5; GND-PTH; Memory-controller-package; Method of Moments; Radiated-Emission; Radiated-Emission of memory-channel; eye-diagram;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on

Conference_Location

Dubrovnik

Print_ISBN

978-1-4577-0862-6

Type

conf

Filename

6130075