• DocumentCode
    560630
  • Title

    A fast-locking clock and data recovery circuit with a lock detector loop

  • Author

    Chen, Chih-Lin ; Wang, Chua-Chin ; Juan, Chun-Ying

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    332
  • Lastpage
    335
  • Abstract
    This work presents a PLL-based (phase-locked loop) clock and data recovery (CDR) circuit with a lock detector loop for fast locking and low jitter. We use an adjustable charge pump to change the charge current according to the state of the lock detector loop, which is determined by seven clocks with equal phase difference. An experimental prototype was implemented using a typical 0.18 μm CMOS process. The post-layout-extracted simulation results reveal that the worst case jitter of the recovery clock is less than 199.66 ps (peak-to-peak) and the settling time is less than 4 μs at all PVT (Process, voltage, and temperature) corners.
  • Keywords
    CMOS integrated circuits; clock and data recovery circuits; phase locked loops; CMOS process; PLL-based clock and data recovery circuit; PVT; adjustable charge pump; charge current; lock detector loop; phase-locked loop clock and data recovery circuit; post-layout-extracted simulation; size 0.18 mum; Charge pumps; Clocks; Detectors; Jitter; Radiation detectors; Synchronization; Voltage-controlled oscillators; CDR; fast-locking; lock detector loop; phase shift;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits (ISIC), 2011 13th International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-61284-863-1
  • Type

    conf

  • DOI
    10.1109/ISICir.2011.6131964
  • Filename
    6131964