DocumentCode
560630
Title
A fast-locking clock and data recovery circuit with a lock detector loop
Author
Chen, Chih-Lin ; Wang, Chua-Chin ; Juan, Chun-Ying
Author_Institution
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
fYear
2011
fDate
12-14 Dec. 2011
Firstpage
332
Lastpage
335
Abstract
This work presents a PLL-based (phase-locked loop) clock and data recovery (CDR) circuit with a lock detector loop for fast locking and low jitter. We use an adjustable charge pump to change the charge current according to the state of the lock detector loop, which is determined by seven clocks with equal phase difference. An experimental prototype was implemented using a typical 0.18 μm CMOS process. The post-layout-extracted simulation results reveal that the worst case jitter of the recovery clock is less than 199.66 ps (peak-to-peak) and the settling time is less than 4 μs at all PVT (Process, voltage, and temperature) corners.
Keywords
CMOS integrated circuits; clock and data recovery circuits; phase locked loops; CMOS process; PLL-based clock and data recovery circuit; PVT; adjustable charge pump; charge current; lock detector loop; phase-locked loop clock and data recovery circuit; post-layout-extracted simulation; size 0.18 mum; Charge pumps; Clocks; Detectors; Jitter; Radiation detectors; Synchronization; Voltage-controlled oscillators; CDR; fast-locking; lock detector loop; phase shift;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-61284-863-1
Type
conf
DOI
10.1109/ISICir.2011.6131964
Filename
6131964
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