• DocumentCode
    56155
  • Title

    Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic Approaches

  • Author

    Sismanoglou, Panagiotis ; Nikolos, Dimitris

  • Author_Institution
    Dept. of Comput. Eng. & Inf., Univ. of Patras, Patras, Greece
  • Volume
    32
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    1762
  • Lastpage
    1775
  • Abstract
    In this paper, we present a new test data compression method for intellectual property (IP) cores testing, based on the reuse of parts of dictionary entries. Two approaches are investigated: the static and the dynamic. In the static approach, the content of the dictionary is constant during the testing of a core, while in the dynamic approach the testing of a core consists of several test sessions and the content of the dictionary is different during each test session. The efficiency of the proposed method is supported with extensive simulation results and comparisons to already known test data compression methods suitable for IP cores testing.
  • Keywords
    automatic test equipment; data compression; dictionaries; logic circuits; logic testing; IP cores testing; dictionary entries; dynamic approach; input test data compression method; intellectual property cores testing; static approach; test sessions; Dictionaries; Encoding; Heuristic algorithms; Indexes; Partitioning algorithms; Test data compression; Testing; Dictionary-based compression; embedded testing techniques; intellectual property (IP) cores; test data compression;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2013.2270433
  • Filename
    6634582