DocumentCode
56155
Title
Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic Approaches
Author
Sismanoglou, Panagiotis ; Nikolos, Dimitris
Author_Institution
Dept. of Comput. Eng. & Inf., Univ. of Patras, Patras, Greece
Volume
32
Issue
11
fYear
2013
fDate
Nov. 2013
Firstpage
1762
Lastpage
1775
Abstract
In this paper, we present a new test data compression method for intellectual property (IP) cores testing, based on the reuse of parts of dictionary entries. Two approaches are investigated: the static and the dynamic. In the static approach, the content of the dictionary is constant during the testing of a core, while in the dynamic approach the testing of a core consists of several test sessions and the content of the dictionary is different during each test session. The efficiency of the proposed method is supported with extensive simulation results and comparisons to already known test data compression methods suitable for IP cores testing.
Keywords
automatic test equipment; data compression; dictionaries; logic circuits; logic testing; IP cores testing; dictionary entries; dynamic approach; input test data compression method; intellectual property cores testing; static approach; test sessions; Dictionaries; Encoding; Heuristic algorithms; Indexes; Partitioning algorithms; Test data compression; Testing; Dictionary-based compression; embedded testing techniques; intellectual property (IP) cores; test data compression;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2013.2270433
Filename
6634582
Link To Document