• DocumentCode
    56199
  • Title

    Development of 2-D Boron Nitride Nanosheets UV Photoconductive Detectors

  • Author

    Aldalbahi, Ali ; Feng, Peter

  • Author_Institution
    Dept. of Chem., King Saud Univ., Riyadh, Saudi Arabia
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    1885
  • Lastpage
    1890
  • Abstract
    We report on our new approach to low-temperature synthesis of high-quality single crystalline wide bandgap boron nitride nanosheets (BNNSs) semiconductor for the development of deep ultraviolet (UV) photoconductive detectors. We focus our experiments on studies of electrical and electronic properties, as well as sensitivity, response and recovery times, and repeatability of newly fabricated deep UV detectors. Raman scattering spectroscopy, X-ray diffraction, scanning electron microscope (SEM), transmission electron microscopy (TEM), and electrometers were used to characterize the BNNS photoconductive materials. The SEM and TEM measurements clearly indicate that each sample consists of a large amount of high-quality BNNSs. High transparency related to high quality of crystalline structures of BNNS has been identified. Based on the synthesized BNNSs, deep UV detector is designed, fabricated, and tested. High sensitivity, quick time responsivity <;0.6 ms has been achieved.
  • Keywords
    Raman spectra; X-ray diffraction; boron compounds; electrometers; nanosensors; nanostructured materials; photoconducting devices; photoconducting materials; photodetectors; scanning electron microscopy; transmission electron microscopy; ultraviolet detectors; 2D boron nitride nanosheet semiconductor; BN; BNNS photoconductive material; BNNS semiconductor; Raman scattering spectroscopy; SEM; TEM; UV photoconductive detector; X-ray diffraction; deep ultraviolet photoconductive detector; electrical property; electrometer; electronic property; high-quality single crystalline wide bandgap boron nitride nanosheet; low-temperature synthesis; scanning electron microscope; transmission electron microscopy; Atomic layer deposition; Detectors; Photodetectors; Photonic band gap; Scanning electron microscopy; Sensitivity; Substrates; Semiconductor detectors; ultraviolet (UV) sources; ultraviolet (UV) sources.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2423253
  • Filename
    7103296