DocumentCode
56199
Title
Development of 2-D Boron Nitride Nanosheets UV Photoconductive Detectors
Author
Aldalbahi, Ali ; Feng, Peter
Author_Institution
Dept. of Chem., King Saud Univ., Riyadh, Saudi Arabia
Volume
62
Issue
6
fYear
2015
fDate
Jun-15
Firstpage
1885
Lastpage
1890
Abstract
We report on our new approach to low-temperature synthesis of high-quality single crystalline wide bandgap boron nitride nanosheets (BNNSs) semiconductor for the development of deep ultraviolet (UV) photoconductive detectors. We focus our experiments on studies of electrical and electronic properties, as well as sensitivity, response and recovery times, and repeatability of newly fabricated deep UV detectors. Raman scattering spectroscopy, X-ray diffraction, scanning electron microscope (SEM), transmission electron microscopy (TEM), and electrometers were used to characterize the BNNS photoconductive materials. The SEM and TEM measurements clearly indicate that each sample consists of a large amount of high-quality BNNSs. High transparency related to high quality of crystalline structures of BNNS has been identified. Based on the synthesized BNNSs, deep UV detector is designed, fabricated, and tested. High sensitivity, quick time responsivity <;0.6 ms has been achieved.
Keywords
Raman spectra; X-ray diffraction; boron compounds; electrometers; nanosensors; nanostructured materials; photoconducting devices; photoconducting materials; photodetectors; scanning electron microscopy; transmission electron microscopy; ultraviolet detectors; 2D boron nitride nanosheet semiconductor; BN; BNNS photoconductive material; BNNS semiconductor; Raman scattering spectroscopy; SEM; TEM; UV photoconductive detector; X-ray diffraction; deep ultraviolet photoconductive detector; electrical property; electrometer; electronic property; high-quality single crystalline wide bandgap boron nitride nanosheet; low-temperature synthesis; scanning electron microscope; transmission electron microscopy; Atomic layer deposition; Detectors; Photodetectors; Photonic band gap; Scanning electron microscopy; Sensitivity; Substrates; Semiconductor detectors; ultraviolet (UV) sources; ultraviolet (UV) sources.;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2423253
Filename
7103296
Link To Document