DocumentCode :
563248
Title :
Characteristics of ion induced secondary emission electron gun
Author :
Chalise, Priya R. ; Watanabe, Masato ; Okino, Akitoshi ; Ko, Kwang-Cheol ; Hotta, Eiki
Author_Institution :
Department of Energy Sciences, Tokyo Institute of Technology, Yokohama, 226-8502, Japan
Volume :
1
fYear :
2002
fDate :
23-28 June 2002
Firstpage :
243
Lastpage :
247
Abstract :
This paper presents some fundamental characteristics of a secondary emission electron gun using a pulsed glow discharge wire ion plasma source (WIPS). The positive helium ions extracted from WIPS are accelerated in vacuum toward the negatively biased cold cathode surface, which is set oblique to the ion loci in order to inject the emitted secondary electrons perpendicular to the foil window. The physical mechanisms governing the characteristics such as space charge and secondary electron emission have been reviewed. The dependence of such characteristics on the kinetic energy of incident ion and on the ion incidence position have been experimentally investigated. The experimental results are discussed together with the available theoretical models of each characteristic to establish the relative understanding of such phenomena in side-extraction-type secondary emission electron gun. The experimental results are further discussed in the light of a self-developed numerical simulation using the finite element method, which presents a good understanding of particle trajectories as well as potential distribution inside the gun geometry.
Keywords :
Electron emission; Microscopy; Trajectory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Power Particle Beams (BEAMS), 2002 14th International Conference on
Conference_Location :
Albuquerque, NM, USA
ISSN :
0094-243X
Print_ISBN :
978-0-7354-0107-5
Type :
conf
Filename :
6219436
Link To Document :
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