• DocumentCode
    563284
  • Title

    Novel applications of intense pulsed ion beams in materials science

  • Author

    Yatsui, K. ; Jiang, W. ; Suematsu, H. ; Endo, F. ; Yang, S.C.

  • Author_Institution
    Extreme Energy Density Research Institute, Nagaoka Univeristy of Technology, Niigata 940-2188, Japan
  • Volume
    1
  • fYear
    2002
  • fDate
    23-28 June 2002
  • Firstpage
    401
  • Lastpage
    404
  • Abstract
    Using pulsed ion beam evaporation technique, experimental studies were carried out to embed metals into via holes in LSI. It will be shown that tungsten is successfully embedded in via holes with the aspect ratio of 4.3. Furthermore, light emission of blue has been observed from a poly silicon nanosize powders, which is also produced by pulsed ion beam evaporation technique.
  • Keywords
    Large scale integration; Magnetic resonance imaging; Plasmas; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Power Particle Beams (BEAMS), 2002 14th International Conference on
  • Conference_Location
    Albuquerque, NM, USA
  • ISSN
    0094-243X
  • Print_ISBN
    978-0-7354-0107-5
  • Type

    conf

  • Filename
    6219473