X-ray wide-band and time-resolved imaging and spectroscopic characterization of hot spots and jets in 0.9–1.0 MA x-pinches

The new results of time-resolved x-ray imaging and spectroscopic study of the development of jets and hot spots in 0.9–1.0 MA x-pinches during the rise of the current are presented. The results of x-pinch radiation properties studies and possible applications of such an x-ray source in a surface physics and backlighting are reported. Experiments were performed with the NTF “Zebra” machine with a peak current of about 1.2 MA, a rise time of 100 ns, a maximum stored energy of 200 kJ, and 1.9 Ω pulse-forming line impedance. X-ray diagnostics include 12 x-ray/EUV devices[l]: x-ray time- and spatial-resolved or time-integrated spectrometers, time-resolved and time-integrated x-ray imaging devices, x-ray polarimeters/spectrometers, fast x-ray and hard x-ray detectors. X-pinch planar-loop and wire twisted configurations were used.