• DocumentCode
    563528
  • Title

    A thermal model for high power devices design

  • Author

    Leturcq, Ph ; Cavalier, C.

  • Author_Institution
    Lab. d´´Autom. et d´´Anal. des Syst., Toulouse, France
  • fYear
    1974
  • fDate
    9-11 Dec. 1974
  • Firstpage
    422
  • Lastpage
    425
  • Abstract
    A simple and precise way of establishing heat flow models is first described, which enables the static temperature distribution in the active region of semiconductor power devices to be determined. Secondly, for a precise device, coupling of the thermal model to a suitable distributed electric model of the active region allows, by a numerical iterative process, the complete simulation of both electrical and thermal aspects of device behaviour, including possible instabilities. This approach for the study of interactive mechanisms in power devices is illustrated by some examples of particular interest.
  • Keywords
    iterative methods; power semiconductor devices; temperature distribution; active region; distributed electric model; heat flow model; high power devices design; numerical iterative process; semiconductor power devices; static temperature distribution; thermal model; Abstracts; Couplings; Electric breakdown; Heating; Numerical models; Silicon; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 1974 International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1974.6219794
  • Filename
    6219794