• DocumentCode
    563536
  • Title

    Progress on an electron beam addressed memory tube for high-capacity, fast access, low cost memory systems

  • Author

    Kelly, John

  • Author_Institution
    Stanford Res. Inst., Menlo Park, CA, USA
  • fYear
    1974
  • fDate
    9-11 Dec. 1974
  • Firstpage
    592
  • Lastpage
    595
  • Abstract
    The development of an experimental Electron Beam Addressed Memory (EBAM) module is described. The module is limited to 65,536 address locations, but its development verifies that tubes of approximately 4 × 106 bits can now be made. The key factors that lead to a practical, stable device are discussed. Emphasis is given to the development of the storage target and its mode of use. The paper shows how a simple refresh technique is used to retain information, provide a nondestructive readout capability, and achieve long-term address stability.
  • Keywords
    electron beam applications; electron beams; memory architecture; nondestructive readout; storage allocation; electron beam addressed memory module; electron beam addressed memory tube; long-term address stability; low cost memory system; nondestructive readout capability; storage target; Abstracts; Electrodes; Electron beams; Electron tubes; Logic gates; Mirrors; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 1974 International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1974.6219806
  • Filename
    6219806