DocumentCode
563536
Title
Progress on an electron beam addressed memory tube for high-capacity, fast access, low cost memory systems
Author
Kelly, John
Author_Institution
Stanford Res. Inst., Menlo Park, CA, USA
fYear
1974
fDate
9-11 Dec. 1974
Firstpage
592
Lastpage
595
Abstract
The development of an experimental Electron Beam Addressed Memory (EBAM) module is described. The module is limited to 65,536 address locations, but its development verifies that tubes of approximately 4 × 106 bits can now be made. The key factors that lead to a practical, stable device are discussed. Emphasis is given to the development of the storage target and its mode of use. The paper shows how a simple refresh technique is used to retain information, provide a nondestructive readout capability, and achieve long-term address stability.
Keywords
electron beam applications; electron beams; memory architecture; nondestructive readout; storage allocation; electron beam addressed memory module; electron beam addressed memory tube; long-term address stability; low cost memory system; nondestructive readout capability; storage target; Abstracts; Electrodes; Electron beams; Electron tubes; Logic gates; Mirrors; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 1974 International
Conference_Location
Washington, DC
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1974.6219806
Filename
6219806
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