DocumentCode
564131
Title
1/f noise temperature behaviour of poly resistors
Author
Pflanzl, Walter C. ; Seebacher, Ehrenfried
Author_Institution
Austriamicrosystems/TAOS, Unterpremstaetten, Austria
fYear
2012
fDate
24-26 May 2012
Firstpage
297
Lastpage
299
Abstract
This paper presents the 1/f noise behaviour over a temperature range from -50°C to +200°C for poly resistor devices with sheet resistance 50 Ω/□ and 1.2 kΩ/□. Based on statistical measurement data a classical approach of 2th order is used to model the flicker noise characterization data as function of temperature with sufficient accuracy.
Keywords
1/f noise; resistors; 1/f noise temperature behaviour; 2th order classical approach; flicker noise characterization data; polyresistor device; sheet resistance; statistical measurement data; temperature -50 degC to 200 degC; 1f noise; Electrical resistance measurement; Noise measurement; Resistance; Resistors; Temperature measurement; 1/f noise; poly resistor; temperature modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed Design of Integrated Circuits and Systems (MIXDES), 2012 Proceedings of the 19th International Conference
Conference_Location
Warsaw
Print_ISBN
978-1-4577-2092-5
Type
conf
Filename
6226203
Link To Document