Title :
1/f noise temperature behaviour of poly resistors
Author :
Pflanzl, Walter C. ; Seebacher, Ehrenfried
Author_Institution :
Austriamicrosystems/TAOS, Unterpremstaetten, Austria
Abstract :
This paper presents the 1/f noise behaviour over a temperature range from -50°C to +200°C for poly resistor devices with sheet resistance 50 Ω/□ and 1.2 kΩ/□. Based on statistical measurement data a classical approach of 2th order is used to model the flicker noise characterization data as function of temperature with sufficient accuracy.
Keywords :
1/f noise; resistors; 1/f noise temperature behaviour; 2th order classical approach; flicker noise characterization data; polyresistor device; sheet resistance; statistical measurement data; temperature -50 degC to 200 degC; 1f noise; Electrical resistance measurement; Noise measurement; Resistance; Resistors; Temperature measurement; 1/f noise; poly resistor; temperature modeling;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2012 Proceedings of the 19th International Conference
Conference_Location :
Warsaw
Print_ISBN :
978-1-4577-2092-5
