DocumentCode :
564173
Title :
Standardization of multigate MOSFET modeling
Author :
Chevillon, Nicolas ; Prégaldiny, Fabien ; Lallement, Christophe ; Sallese, Jean-Michel
Author_Institution :
InESS, Univ. de Strasbourg, Illkirch, France
fYear :
2012
fDate :
24-26 May 2012
Firstpage :
78
Lastpage :
83
Abstract :
A fully explicit and physics-based model has been developed for arbitrary shapes of lightly doped long-channel nonplanar multigate MOSFETs (MuGFETs). Through the definition of equivalent geometrical parameters, MuGFETs as quadruple-gate (QG), triple-gate (TG), triangular gate, cylindrical gate-all-around (GAA), and FinFETs, are mapped into the symmetric double-gate (DG) MOSFET topology without the need to introduce any unphysical parameter. Based on this modeling approach, any multigate architecture inherits of the fundamental relationships that have been developed for planar DG MOSFETs, including the normalization of all electrical quantities that considerably simplifies its analysis. We propose here to extend the validity of this MuGFETs standard model to short channels through a 2-D short-channel effect modeling of the DG FinFET. 3-D numerical simulations of small geometries of TG MOSFETs are compared with the model.
Keywords :
MOSFET; numerical analysis; semiconductor device models; 2D short-channel effect modeling; 3D numerical simulations; DG FinFET; GAA MuGFET; MuGFET standard; TG MOSFET; cylindrical gate-all-around MuGFET; equivalent geometrical parameters; long-channel nonplanar multigate MOSFETs; multigate MOSFET modeling standardization; physics-based model; planar DG MOSFET; quadruple-gate MuGFET; symmetric DG MOSFET topology; symmetric double-gate MOSFET topology; triangular gate MuGFET; triple-gate MOSFET; Biological system modeling; Logic gates; MOSFETs; Solid modeling; 3-D TCAD simulations; multigate MOSFET; short-channel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2012 Proceedings of the 19th International Conference
Conference_Location :
Warsaw
Print_ISBN :
978-1-4577-2092-5
Type :
conf
Filename :
6226280
Link To Document :
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