• DocumentCode
    564244
  • Title

    The UWB through-wall propagation channel measurement and analysis from 1GHz to 2GHz

  • Author

    Feng, Di ; Ren, Jingjing ; Chai, Shougang ; Chen, Weidong

  • Author_Institution
    Dept. of Electron. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China, Hefei, China
  • Volume
    2
  • fYear
    2012
  • fDate
    5-8 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a time-domain measurement in the UWB through-wall propagation environment is performed. The Saleh-Valenzuela (S-V) model is used for the UWB through-wall propagation channel modeling in the frequency band of 1-2GHz. The model in the given scene is built and analyzed to investigate the channel characteristics and estimate the key parameters. The bit error rate (BER) analysis is used as a means of evaluating the performance of the estimated parameters. Two Monte Carlo simulations based on our channel parameters and IEEE 802.15.3a´s are carried out to obtain the numerical BERs. From the comparison of the measured BERs and numerical BERs, it can be verified that in the UWB through-wall propagation environment, the key parameters estimated in the time-domain measurement are closer to the practical situation.
  • Keywords
    Monte Carlo methods; UHF radio propagation; error statistics; numerical analysis; parameter estimation; time-domain analysis; ultra wideband communication; wireless channels; IEEE 802.15.3a; Monte Carlo simulations; S-V model; Saleh-Valenzuela model; UWB through-wall propagation channel measurement; bit error rate; channel modeling; frequency 1 GHz to 2 GHz; key parameter estimation; numerical BER analysis; time-domain measurement; Bit error rate; Channel estimation; Delay; Frequency measurement; IEEE 802.15 Standards; Receivers; Time domain analysis; S-V model; UWB; bit error rate analysis; through-wall propagation; time-domain measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology (ICMMT), 2012 International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4673-2184-6
  • Type

    conf

  • DOI
    10.1109/ICMMT.2012.6230087
  • Filename
    6230087