EM immunity study of serial links

Author

Fontana, M. ; Rigazio, L. ; Canavero, F.G. ; Perraud, R.

Author_Institution

Dip. di Elettron. e Telecomun., Politec. di Torino, Torino, Italy

fYear

2012

fDate

21-23 May 2012

Firstpage

1

Lastpage

6

Abstract

This paper proposes a systematic study of IC immunity for a TX/RX digital system, implemented in a FPGA board. A DPI setup is used to measure the immunity of signal I/O ports to conducted continuous-wave interference. The injection path from RF noise source to input pin is characterized to define the injected power level causing a malfunction on the TX/RX system, up to 250 MHz. The impact of data coding on immunity measurement is analyzed by comparing error rates of Flexray coded data over a standard serial transmission protocol.

Keywords

digital systems; field programmable gate arrays; peripheral interfaces; radiofrequency interference; DPI setup; EM immunity study; FPGA board; Flexray coded data error rates; IC immunity; RF noise source; TX-RX digital system; conducted continuous-wave interference; data coding; frequency 250 MHz; immunity measurement; injected power level; injection path; input pin; serial links; signal I-O ports immunity; standard serial transmission protocol; Error analysis; Immunity testing; Noise; Protocols; Radio frequency; Receivers; Synchronization;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace EMC, 2012 Proceedings ESA Workshop on

Conference_Location

Venice

Print_ISBN

978-1-4673-0302-6

Type

conf

Filename

6232542